H. Hibino, H. Kageshima, F. Maeda, M. Nagase, Y. Kobayashi, and H. Yamaguchi,
"Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons"
Phys. Rev., B77(2008)075413
T. Yamazaki, K. Kuramochi, D. Takagi, Y. Homma, F. Nishimura, N. Hori, K. Watanabe, S. Suzuki and Y. Kobayashi,
"Ordered fullerene nanocylinders in large-diameter carbon nanotubes",
Nanotechnology, 19(2008)045702.
Daisuke Takagi, Yoshihiro Kobayashi, Hiroki Hibino, Satoru Suzuki, and Yoshikazu Homma,
“Mechanism of Gold-Catalyzed Carbon Material Growth”,
Nanoletters 8(2008)832-835.
H. Hibino, H. Kageshima, F. Maeda, M. Nagase, Y. Kobayashi, Y. Kobayashi, and H. Yamaguchi,
“Thickness Determination of Graphene Layers Formed on SiC Using Low-Energy Electron Microscopy”,
e-J. Surf. Sci. Nanotech. 6(2008)107-110
S. Suzuki, Y. Kobayashi,
“Threshold Energy of Low-Energy Irradiation Damage in Single-Walled Carbon Nanotubes”,
Jpn. J. Appl. Phys., 47(2008)2040-2043.
Satoru Suzuki, Jun-ichi Hashimoto, Toshio Ogino, and Yoshihiro Kobayashi,
“Electric Property Control of Carbon Nanotubes by Defects”,
Jpn. J. Appl. Phys., 47(2008)3292-3295.
Takashi Uchida, Masaya Tazawa, Hiroshi Sakai, Akira Yamazaki, Yoshihiro Kobayashi,
“Radial breathing modes of single-walled carbon nanotubes in resonance Raman spectra at high temperature and their chiral index assignment”,
Appl. Surf. Sci. 254(2008)7591-7595.
Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi,
"Modeling tip performance for combined STM-luminescence and aperture-SNOM scanning probe: spatial resolution and collection efficiency",
Appl. Surf. Sci., 254(2008)7861-7863.
Fumihiko Maeda, and Yoshihiro Kobayashi,
"Proper Combination of Catalyst Materials and Ethanol for High Yield in CVD Growth of Carbon Nanotubes",
Mater. Res. Soc. Symp. Proc. Vol. 1081 (2008) 1081-P01-03.
Ilya Sychugov , Hiroo Omi and Yoshihiro Kobayashi,
"On the Role of Substrate in Light Harvesting Experiments",
Opt. Lett., 33(2008)1807-1809.
A. Tokura, F. Maeda, Y. Teraoka, A. Yoshigoe, D. Takagi, Y. Homma, Y. Watanabe, Y. Kobayashi
"Hydrogen adsorption on single-walled carbon nanotubes studied by core-level photoelectron spectroscopy and Raman spectroscopy",
Carbon, 48(2008)1903-1908.
K. Shoda, H. Kohno, Y. Kobayashi, D. Takagi, and S. Takeda,
"Feasibility study for sidewall fluorination of SWCNTs in CF4 plasma",
J. Appl. Phys. 104(2008)113529-1~6
F. Maeda, H. Hibino, S. Suzuki and F. Z. Guo,
"Oxide-mediated formation of a-FeSi2 on Si(001) studied by X-ray adsorption near edge structure analysis using SPELEEM",
Surf. Interface Anal. 40(2008)1747-1750.
H. Ohno, D. Takagi, K. Yamada, S. Chiashi, A. Tokura, and Y. Homma,
"Growth of vertically aligned single-walled carbon nanotubes on alumina and sapphire substrates",
Jpn. J. Appl. Phys. 47(2008)1956-1960
H. Hibino, H. Kageshima, F.-Z. Guo, F. Maeda, M. Kotsugi, and Y. Watanabe,
"Two-dimensional emission patterns of secondary electrons from graphene layers formed on SiC(0001)",
Appl. Surf. Sci. 254 (2008) 7596-7599.
M. Nagase, H. Hibino, H. Kageshima, and H. Yamaguchi,
"Local conductance measurement of few-layer graphene on SiC substrtae using an integrated nanogap probe",
J. Phys.: Conf. Series 100 (2008) 052006.
H. Hibino, H. Kageshima, and M. Uwaha,
"Instability of steps during Ga deposition on Si(111)",
Surf. Sci. 602 (2008) 2421-2426.
M. Nagase, H. Hibino, H. Kageshima, and H. Yamaguchi,
"In-plane conductance measurement of graphene nanoislands using integrated nanogap probe",
Nanotechnology 19 (2008) 495701.
Yuan-Liang Zhong, Hayato Nakano, Tatsushi Akazaki, Kenichi Kanzaki,Yoshihiro Kobayashi, Hideaki Takayanagi
"Superconducting proximity effect and reentrant behaviors in random network carbon nanotubes"
Physica C 468 (2008) 709?713.
International Conference
H. Hibino,
"Microscopic determination of number of graphene layers on SiC",
Symposium on Surface and Nono Science 2008 (SSNS'2008), Appi, Japan (Jan. 22-25, 2008).
Satoru Suzuki and Yoshihiro Kobayashi ,
"Low-Energy Irradiation Damage in Single-Walled Carbon Nantoubes: Defect Characteristics and Electric Property Control",
invited poster, International Carbon Nanotube Conference in NU (ICNCNU), Nagoya, Japan (Feb. 13-14, 2008)
Takashi Uchida, Masaya Tazawa, Hiroshi Sakai, Akira Yamazaki, Yoshihiro Kobayashi,
" Chirality-resolved in-situ Raman spectroscopy of single-walled carbon nanotube growth",
poster, International Carbon Nanotube Conference in NU (ICNCNU), Nagoya, Japan (Feb. 13-14, 2008)
Takashi Uchida, Masaya Tazawa, Hiroshi Sakai, Akira Yamazaki, Yoshihiro Kobayashi,
" Chirality-resolved kinetic analysis of single-walled carbon nanotube growth by in-situ Raman spectroscopy",
V29.00011(oral), APS March Meeting, New Orleans, USA (March 10-14, 2008)
Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi,
"STM and SNOM Type of Scanning Probe Microscopes in the Same Unit: Towards Electrical Modification and Optical Characterization at Nanoscale",
V36.00008(oral,) APS March Meeting, New Orleans, USA (March 10-14, 2008)
Fumihiko Maeda and Yoshihiro Kobayashi
"Proper Combination of Catalyst Materials and Ethanol for High Yield in CVD Growth of Carbon Nanotubes"
P1.3(oral), Symposium P:Carbon Nanotubes and Related Low-Dimensional Materials, 2008 MRS Spring Meeting, San Francisco, USA (March 24 - 28, 2008)
H. Hibino,
"Number-of-layers dependence of electronic properties of epitaxial graphene investigated by SPELEEM",
invited speaker, 5th International Workshop on Nanoscale Spectroscopy and Nanotechnology (NSS5), Athens, Ohio, USA (July 15-19, 2008).
Masao Nagase, Hiroki Hibino, Hiroyuki Kageshima and Hiroshi Yamaguchi,
"Local conductance of graphene layer near the buried atomic steps on SiC substrate",
The 2008 International Conference on Nanoscience + Technology (ICN+T), Colorado, USA (July 20-25, 2008).
Takashi Uchida, Akira Yamazaki, Yoshihiro Kobayashi,
"Temperature effects in Raman spectra from single-walled carbon nanotubes and assignments of their chiral indices at high temperature", oral, Carbon2008, Nagano, Japan (July 13-18, 2008)
M. Nagase, H. Hibino, H. Kageshima, H. Yamaguchi,
"In-plane conductance images of few-layer graphene on SiC substrate",
The IEEE Nanotechnology Materials and Devices Conference (NMDC2008), Kyoto, Japan (Oct. 20-22, 2008).
Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi,
“On the Collection of Light from a Nanoparticle at the Interface”,
oral presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
F. Maeda and Y. Kobayashi,
“Chemical and morphological effects on catalyst activities for carbon nanotube growth”,
oral presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
H. Sakai, D. Takagi and Y. Kobayashi,
“Single-walled carbon nanotube growth from gold catalyst at low temperature”,
oral presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
H. Omi, H. Kagesima, M. Uematsu, T. Kawamura, Y. Kobayashi, S. Fujikawa, Y. Tsusaka, Y. Kagoshima and J. Matsui,
"Temperature dependent roughening at the growing SiO2/Si(001) interface",
Poster presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
S. Suzuki, T. Mizuno, H. Maki, Y. Kobayashi,
"Graphene-like thin film growth on SiO2 substrates",
Poster presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
K. Yamaya, S. Suzuki, Y. Homma, Y. Kobayashi,
"Activation energy of healing of low-energy irradiation-induced defects in single-walled carbon nanotubes",
Poster presentation, International Symposium on Surface Science and Nanotechnology (ISSS-5), Tokyo, Japan (November 9-13, 2008)
H. Hibino, H. Kageshima, M. Kotsugi, and Y. Watanabe,
"Local work function measurements of epitaxial few-layer graphene",
invited speaker, 5th International Symposium on Surface Science and Nanotechnology (ISSS-5), Waseda, Japan (Nov. 9-13, 2008).
H. Kageshima, H. Hibino, M. Nagase, and H. Yamaguchi,
"First-principles Study on Epitaxial Graphene Formation on SiC (0001) Surfaces",
invited speaker, 5th International Symposium on Surface Science and Nanotechnology (ISSS-5), Waseda, Japan (Nov. 9-13, 2008).
N. Akutsu, H. Hibino, and T. Yamamoto,
"A lattice model for thermal decoration and step bunching in vicinal surface with sub-monolayer adsorbates",
5th International Symposium on Surface Science and Nanotechnology (ISSS-5), Waseda, Japan (Nov. 9-13, 2008).
H. Hibino, M. Nagase, C. Jackson, H. Kageshima, Y. Kobayashi, and H. Yamaguchi,
"Evaluation of the number of graphene layers on SiC: SPM AND RAMAN Spectroscopy studies",
The International Symposium on Graphene Devices: Technology, Physics, and Modeling (ISGD 2008), Aizu, Japan, (Nov. 17-19, 2008).
H. Kageshima, K. Hibino, M. Nagase, and H. Yamaguchi,
"Theoretical study on epitaxial graphene formation on SiC(0001) surfaces",
The International Symposium on Graphene Devices: Technology, Physics, and Modeling (ISGD 2008), Aizu, Japan, (Nov. 17-19, 2008).
M. Nagase, H. Hibino, H. Kageshima, and H. Yamaguchi,
"Local conductance measurement of thermally grown graphene on SiC substrate",
The International Symposium on Graphene Devices: Technology, Physics, and Modeling (ISGD 2008), Aizu, Japan, (Nov. 17-19, 2008).
S. Tanaka, K. Hayashi, K. Motita, S. Chenda, Y. Hagihara, S. Mizuno, H. Hibino, T. Shirasawa, K. Nakatsuji, and F. Komori,
"Uniform thickness distribution of graphene layers on vicinal SiC surfaces",
The International Symposium on Graphene Devices: Technology, Physics, and Modeling (ISGD 2008), Aizu, Japan, (Nov. 17-19, 2008).
Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi,
“In situ Optical and Electrical Characterization at Nanoscale by a Transparent Probe of a Scanning Tunneling Microscope”,
NN11.5(oral), Symposium NN: In-situ Studies across Spatial and Temporal Scales for Nanoscience and Technology, 2008 MRS Fall Meeting, Boston, USA (Dec. 1-5, 2008)
M. Nagase, H. Hibino, H. Kageshima, H. Yamaguchi,
"Local conductance measurement of deformed double-layer graphene on atomic step-structures of SiC substrate",
13th Advanced Heterostructures and Nanostructures Workshop (AHNW), Hawaii, USA (Dec. 7-12, 2008).